Wellauer, T., Cresswell, D. L., Newson, E. J.
American Chemical Society
|
Copeland, R., Cesario, M., Dubovik, M., Feinberg, D., Sibold, J., Windecker, B., Yang, J.
American Institute of Chemical Engineers
|
Fatemeh Khodadadian, Zonghan Li, J. Ruud Van Ommen, Andrzej Stankiewicz, Richard Lakerveld
American Institute of Chemical Engineers
|
III,D.R.Holmes, Camp,J.J., Robb,R.A.
SPIE-The International Society for Optical Engineering
|
D.S. Lee, G. Sin, G. Insel, I. Nopens, P.A. Vanrolleghem
Elsevier
|
Han, J.J., Choi, J.H., Park, J.J., Yang, J.D., Lee, J.K.
IEEE Computer Society Press
|
A.E. Cunha, J.J. Clemente, R. Oliveira, M.J.T. Carrondo
American Institute of Chemical Engineers
|
Vaishali Suryawanshi, Shantanu Roy, Patrick L. Mills
American Institute of Chemical Engineers
|
Hua Bai, Michael D. Cloeter, Subrata Sen
American Institute of Chemical Engineers
|
Hahn, D.W., Bui-Pham, M.N., Meeks, E., Kee, R.J.
Electrochemical Society
|
Roberts,J.D., SantaPietro,J.J.
SPIE-The International Society for Optical Engineering
|
D.J. Meyer, E. Suvar, F. Rohlfing, T. Grabolla
Electrochemical Society
|