Gupta, R.S., Hunteman, J.E., Collins, M.J., Crawford, D.B., Kellogg, M.W.
American Institute of Chemical Engineers
|
S. Sato, M.D. Henschel
ESA Communications
|
Doan, Vincent V., Curtis, C.L., Credo, G.M., Sailor, M.J., Penner, R.M.
Materials Research Society
|
Binzel L. M., Hess D. F., Bressan A. R., Hasegawa M. P.
Springer-Verlag
|
Bayliss, S., Ewart, F.T., Howse, R.M., Lane, S.A., Pilkington, N.J., Smith-Briggs, J.L., Williams, S.J.
Materials Research Society
|
Potyrailo, R.A., Chisholm, B.J., Olson, D.R., Brennan, M.J., Mioaison, C.A.
SPIE-The International Society for Optical Engineering
|
Pruessner, K., Heo, Y.-W., Kaufman, M.J., Chisholm, M.F., Norton, D. P.
Electrochemical Society
|
Christiansen, R. L,, Gilman, J. R., Jargon, J. R., Kazemi, H., Smith, R. E.
American Institute of Chemical Engineers
|
Verónica M. Sanchez, Caetano R. Miranda
American Institute of Chemical Engineers
|
Qinhong Wang, Xiangdong Fang, Patrick J. Shuler, Yongchun Tang, William A. Goddard III
American Institute of Chemical Engineers
|
Verónica M. Sanchez, Caetano R. Miranda
American Institute of Chemical Engineers
|
Knapp, J.A., Guilinger, T.R., Kelly, M.J., Walsh, D., Doyle, B.L.
Materials Research Society
|