X. H. Tang, A. P. Zhang, J. Lju, N. I. Fu
Elsevier
|
Ming Zhang, Zhiqiang He, Yun Fang
American Institute of Chemical Engineers
|
Zhang,W., Le,Y., Liu,X., Tang,Y., Sun,J.
SPIE - The International Society for Optical Engineering
|
Ming Zhang, Zhiqiang He, Yun Fang
American Institute of Chemical Engineers
|
Rigutto, M. S., Vries, H. J. A. de, Magill, S. R., Hoefnagel, A. J., Bekkum, H. van
Elsevier
|
Ming Zhang, Zhiqiang He, Yun Fang
American Institute of Chemical Engineers
|
Roberge, D.M., Holderich, W.F.
Elsevier
|
Li, X. -W., Han, M., Liu, X. -Y., Pei, Z. -F., She, L.
Elsevier
|
Ashton G. A., Barri I. A. S., Cartlidge S., Dwyer J.
D.Reidel Publishing Company
|
Liu,X., Zhang,W., Le,Y., Tang,Y., Sun,J., Liang,P.
SPIE-The International Society for Optical Engineering
|
Ming Zhang, Zhiqiang He, Yun Fang
American Institute of Chemical Engineers
|
Ganti, R., Bhatia, S.
Elsevier
|