Anderson, J. A., Paterson, A. J., Garcia, M. Fernandez
Elsevier
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Ramirez-Cuesta, A.J., Mitchell, P.C.H., Parker, S.F., Tomkinson, J., Thompsett, D.
Elsevier
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Paterson, J.
Kluwer Academic Publishers
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Bedinger,P.A., Hohorst,D.L., Stratford,S., Barnes,W., Sagert,J.G., Cotter,R., Golubiewski,A., Anderson,J.R., …
IOS Press
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Ashok Kumar, Robert D. Clayton, Michael Harold, Vemuri Balakotaiah
American Institute of Chemical Engineers
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Joshua L. Ratts, Lasitha Cumaranatunge, W. Nicholas Delgass, Aleksey Yezerets, Neal W. Currier
American Institute of Chemical Engineers
|
Zhenjuan Ni, Payoli Aich, Max Hoffmann, Karsten Reuter, Randall J. Meyer
American Institute of Chemical Engineers
|
Beñat Pereda-Ayo, Juan J. Delgado, Rubén López-Fonseca, José J. Calvino, Serafín Bernal
American Institute of Chemical Engineers
|
Zhenjuan Ni, Payoli Aich, Max Hoffmann, Karsten Reuter, Randall J. Meyer
American Institute of Chemical Engineers
|
Todd J. Toops, Nathan A. Ottinger, Chengdu Liang, Josh A. Pihl
American Institute of Chemical Engineers
|
Kaufman, A.J., Moen, D.
American Society of Mechanical Engineers
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Anderson, D.J.
SPIE-The International Society for Optical Engineering
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