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Chemical Force Microscopies by Friction and Adhesion Using Chemically Modified Atomic Force Microscope (AFM) Tips

Author(s):
Fujihira, M.
Tani, Y.
Furugori, M.
Okabe, Y.
Akiba, U.
Yagi, K.
Okamoto, S.
2 more
Publication title:
Proceedings of the International Conference on Colloid and Surface Science, Tokyo, Japan, November 5-8, 2000 : 25th Anniversary of the Division of Colloid and Surface Chemistry, the Chemical Society of Japan
Title of ser.:
Studies in surface science and catalysis
Ser. no.:
132
Pub. Year:
2001
Page(from):
469
Page(to):
476
Pages:
8
Pub. info.:
Amsterdam: Elsevier
ISSN:
01672991
ISBN:
9780444506511 [0444506519]
Language:
English
Call no.:
S76950
Type:
Conference Proceedings

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