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Low-frequency noise parameter extraction in poly-Si thin-film transistors

Author(s):
Nam, H. ( Korea Institute of Science and Technology (South Korea) )
Yang, H. -S. ( Chung-Ang Univ. (South Korea) )
Lee, J. ( Korea Institute of Science and Technology (South Korea) )
Chovet, A. ( IMEP, CNRS/INPG (France) )
Szentpali, B. ( Research Institute for Technical Physics and Materials Science (Hungary) )
Kim, E. ( Hanyang Univ. (South Korea) )
1 more
Publication title:
Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5844
Pub. Year:
2005
Page(from):
200
Page(to):
207
Pages:
8
Pub. info.:
Bellingham, Washington: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458391 [0819458392]
Language:
English
Call no.:
P63600/5844
Type:
Conference Proceedings

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