Multivariate analysis of photonic crystal microcavities with fabrication defects

Multivariate analysis of photonic crystal microcavities with fabrication defects

Author(s):

Rico-Garcia, J. M. ( Univ. Complutense de Madrid (Spain) )
Lopez-Alonso, J. M. ( Univ. Complutense de Madrid (Spain) )
Alda, J. ( Univ. Complutense de Madrid (Spain) )

Publication title:

Photonic Materials, Devices, and Applications

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5840

Pub. Year:

2005

Page(from):

562

Page(to):

571

Pages:

10

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819458353 [081945835X]

Language:

English

Call no.:

P63600/5840-2

Type:

Conference Proceedings

Details

TDL ID:	ZA00015074
Series ID:	PA00000029
Conf. info. (Name):	SPIE Microtechnologies : Photonic Materials, Devices, and Applications
Conf. info. (Number):	2005
Conf. info. (Venue):	Seville, Spain
Conf. info. (Date):	2005.05.09-2005.05.11

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