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The influence of light on the gas sensitive properties of microstructured metal oxide thin films

Author(s):
  • Moretton, E. ( Fraunhofer Institute for Physical Measurement Techniques (Germany) )
  • Hildenbrand, J. ( Fraunhofer Institute for Physical Measurement Techniques (Germany) )
  • Lambrecht, A. ( Fraunhofer Institute for Physical Measurement Techniques (Germany) )
  • Wollenstein, J. ( Fraunhofer Institute for Physical Measurement Techniques (Germany) )
Publication title:
Smart sensors, actuators, and MEMS II : 9-11 May 2005, Seville, Spain
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5836
Pub. Year:
2005
Page(from):
696
Page(to):
702
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458315 [0819458317]
Language:
English
Call no.:
P63600/5836
Type:
Conference Proceedings

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