Production challenges of making EUV mask blanks

Production challenges of making EUV mask blanks

Author(s):

Seitz, H. ( SCHOTT Lithotec AG (Germany) )

Sobel, F. ( SCHOTT Lithotec AG (Germany) )

Renno, M. ( SCHOTT Lithotec AG (Germany) )

Leutbecher, T. ( SCHOTT Lithotec AG (Germany) )

Olschewski, N. ( SCHOTT Lithotec AG (Germany) )

Reichardt, T. ( SCHOTT Lithotec AG (Germany) )

Walter, R. ( SCHOTT Lithotec AG (Germany) )

Becker, H. ( SCHOTT Lithotec AG (Germany) )

Buttgereit, U. ( SCHOTT Lithotec AG (Germany) )

HeB, G. ( SCHOTT Lithotec AG (Germany) )

Knapp, K. ( SCHOTT Lithotec AG (Germany) )

Wies, C. ( AIXUV GmbH (Germany) )

Lebert, R. ( AIXUV GmbH (Germany) )

8 more

Publication title:

EMLC 2005 : 21st European Mask and Lithography Conference : 31 January-3 February, 2005, Dresden, Germany

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5835

Pub. Year:

2005

Page(from):

244

Page(to):

251

Pages:

8

Pub. info.:

Bellingham, Wash.,: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819458308 [0819458309]

Language:

English

Call no.:

P63600/5835

Type:

Conference Proceedings

Details

TDL ID:	ZA00015067
Series ID:	PA00000029
Conf. info. (Name):	EMLC : European Mask and Lithography Conference
Conf. info. (Number):	2005 : 21st
Conf. info. (Venue):	Dresden, Germany
Conf. info. (Date):	2005.01.31-2005.02.03

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