Progress on EUV-source development, tool integration, and applications

Progress on EUV-source development, tool integration, and applications

Author(s):

Lebert, R. ( AIXUV GmbH (Germany) )

Jagle, B. ( AIXUV GmbH (Germany) )

Wies, C. ( AIXUV GmbH (Germany) )

Stamm, U. ( XTREME technologies (Germany) )

Kleinschmidt, J. ( XTREME technologies (Germany) )

Gaebel, K. ( XTREME technologies (Germany) )

Schriever, G. ( XTREME technologies (Germany) )

Pankert, J. ( Philips EUV GmbH (Germany) )

Bergmann, K. ( Fraunhofer-Institut fur Lasertechnik (Germany) )

Neff, W. ( Fraunhofer-Institut fur Lasertechnik (Germany) )

Egbert, A. ( Phoenix EUV (Germany) )

6 more

Publication title:

EMLC 2005 : 21st European Mask and Lithography Conference : 31 January-3 February, 2005, Dresden, Germany

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5835

Pub. Year:

2005

Page(from):

230

Page(to):

243

Pages:

14

Pub. info.:

Bellingham, Wash.,: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819458308 [0819458309]

Language:

English

Call no.:

P63600/5835

Type:

Conference Proceedings

Details

TDL ID:	ZA00015067
Series ID:	PA00000029
Conf. info. (Name):	EMLC : European Mask and Lithography Conference
Conf. info. (Number):	2005 : 21st
Conf. info. (Venue):	Dresden, Germany
Conf. info. (Date):	2005.01.31-2005.02.03

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