Blank Cover Image

Optical and structural characterization of as-deposited and annealed ZrO2 thin films obtained by PIAD

Author(s):
Publication title:
Opto-Ireland 2005: Optical Sensing and Spectroscopy
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5826
Pub. Year:
2005
Page(from):
371
Page(to):
378
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458117 [0819458112]
Language:
English
Call no.:
P63600/5826
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Optical Characterization of Solid Phase Crystallization of Silicon Thin Films Obtained by LPCVD

Modreanu, M., Gartner, M., Cobianu, C., Hurley, P.

Electrochemical Society
7 Conference Proceedings X-Ray Diffraction Measurements on c-Axis Oriented YBaCuO Thin Films Deposited by Metalorganic Vapour Deposition

Bassas,J., Alcobe,X., Doudkowsky,M., Santiso,J., Berton,S., Figueras,A.

Trans Tech Publications
2 Conference Proceedings Optical characterization of high-k dielectrics HfO2 thin films obtained by MOCVD

Modreanu, M., Hurley, P.K., O'Sullivan, B.J., O'Looney, B., Senateur, J.-P., Rousell, H., Rousell, F., Audier, M., …

SPIE-The International Society for Optical Engineering
8 Conference Proceedings Structural and optical properties of PLZT thin films deposited by pulsed laser deposition

Lancok,J., Jelinek,M., Escoubas,L., Flory,F.

SPIE-The International Society for Optical Engineering
3 Conference Proceedings Optical characterization of materials in sol-gel dip coatings

Ferrara, M.C., Mazzarelli, S., Sancho-Parramon, J., Bosch, S.

SPIE - The International Society of Optical Engineering
9 Conference Proceedings ZrO2 thin films deposited on various LiB3O5 substrates by electron beam evaporation

Tan, T., Huang, J., Zhan, M., Tian, G., Shao, J., Fan, Z.

SPIE - The International Society of Optical Engineering
4 Conference Proceedings Study of the oxidization of ns-SiNx:H thin films using FTIR phase modulated ellipsometry

Sancho-Parramon, J., Bosch, S., Pinyol, A., Bertran, E., Canillas, A.

SPIE - The International Society of Optical Engineering
10 Conference Proceedings Optical and photoelectrical characterization of as-deposited and annealed PECVD polysilicon thin films

Khomich, A.V., Kovalev, V.I., Vedeneev, A.S., Kazanskii, A.G., Forsh, P.A., He, D., Wang, X.Q., Mell, H., Vlasov, I.I., …

SPIE - The International Society of Optical Engineering
5 Conference Proceedings Modification of optical properties of metal island films by electric field-assisted dissolution of clusters

J. Sancho-Parramon, V. Janicki, H. Zorc, M. Lonč arić

Society of Photo-optical Instrumentation Engineers
11 Conference Proceedings Annealing studies of solution-deposited ZrO2 thin films on self-assembled monolayers

Ritley,K.A., Schreiber,F., Just,K.-P., Dosch,H., Niesen,T.P., Aldinger,F.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings Optical Characaterization of LPCVD SiOxNy Thin Films

Modreanu, M., Gartner, M., Tomozeiu, N.

Electrochemical Society
12 Conference Proceedings Structural study of ZrO2 and HfO2 thin films grown by atomic layer deposition [5946-14]

Niilisk, A., Aarik, J., Uustare, T., Mamdar, H, Tkachev, S., Manghnani, M.

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12