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EUV spectroscopy of xenon ions created using an electron beam ion trap

Author(s):
Fahy, K. ( Univ. College Dublin (Ireland) )
Sokell, E. ( Univ. College Dublin (Ireland) )
O'Sullivan, G. ( Univ. College Dublin (Ireland) )
Cummings, A. ( Univ. College Dublin (Ireland) )
Aguilar, A. ( National Institute of Standards and Technology (USA) )
Gillaspy, J. D. ( National Institute of Standards and Technology (USA) )
Pomeroy, J. M. ( National Institute of Standards and Technology (USA) )
Tan, J. N. ( National Institute of Standards and Technology (USA) )
3 more
Publication title:
Opto-Ireland 2005: Optical Sensing and Spectroscopy
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5826
Pub. Year:
2005
Page(from):
351
Page(to):
362
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458117 [0819458112]
Language:
English
Call no.:
P63600/5826
Type:
Conference Proceedings

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