Empirical comparison of robustness of classifiers on IR imagery

Empirical comparison of robustness of classifiers on IR imagery

Author(s):

Zhang, P. ( Tulane Univ. (USA) )
Peng, J. ( Tulane Univ. (USA) )
Zhang, K. ( Tulane Univ. (USA) )
Sims, S. R. F. ( U. S. Army RD&E Command (USA) )

Publication title:

Automatic target recognition XV : 29-31 March 2005, Orlando, Florida, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5807

Pub. Year:

2005

Page(from):

370

Page(to):

379

Pages:

10

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819457929 [0819457922]

Language:

English

Call no.:

P63600/5807

Type:

Conference Proceedings

Details

TDL ID:	ZA00015040
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Automatic Target Recognition
Conf. info. (Number):	2005 : 15th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	2005.03.29-2005.03.31

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