Noise limitations in millimeter-wave detection via optical upconversion

Noise limitations in millimeter-wave detection via optical upconversion

Author(s):

Schuetz, C. A. ( Univ. of Delaware (USA) )
Schneider, G. J. ( Univ. of Delaware (USA) )
Murakowski, J. ( Univ. of Delaware (USA) )
Prather, D. W. ( Univ. of Delaware (USA) )

Publication title:

Passive millimeter-wave imaging technology VIII : 30-31 March 2005, Orlando, Florida, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5789

Pub. Year:

2005

Page(from):

51

Page(to):

58

Pages:

8

Pub. info.:

Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819457745 [0819457744]

Language:

English

Call no.:

P63600/5789

Type:

Conference Proceedings

Details

TDL ID:	ZA00015020
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Passive Millimeter-Wave Imaging Technology
Conf. info. (Number):	2005 : 8th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	2005.03.30-2005.03.31

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