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Characterization of ZnO films grown on different substrates by L-MBE method

Author(s):
Yang, X. ( Xi'an Jiaotong Univ. (China), Xi'an Institute of Optics and Precision Mechanics, CAS (China), and Graduate School of the Chinese Academy of Sciences (China) )
Zhang, J. ( Xi'an Jiaotong Univ. (China) and Xi'an Institute of Optics and Precision Mechanics. CAS (China) )
Xu, Q. ( Xi'an Jiaotong Univ. (China), Xi'an Institute of Optics and Precision Mechanics. CAS (China), and Graduate School of the Chinese Academy of Sciences (China) )
He, Y. ( Xi'an Jiaotong Univ. (China) )
Wang, H. ( Xi'an Jiaotong Univ. (China) )
Zhang, W. ( Henan Univ. (China) )
Hou, X. ( Xi'an Jiaotong Univ. (China), Xi'an Institute of Optics and Precision Mechanics. CAS (China), Graduate School of the Chinese Academy of Sciences (China), and Henan Univ. (China) )
2 more
Publication title:
Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5774
Pub. Year:
2004
Page(from):
369
Page(to):
372
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457554 [0819457558]
Language:
English
Call no.:
P63600/5774
Type:
Conference Proceedings

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