X-ray microscopy for NDE of micro- and nano-structrues(Invited Paper)
- Author(s):
- Wang, S. ( Xradia, Inc. (USA) )
- Duewer, F. ( Xradia, Inc. (USA) )
- Feser, M. ( Xradia, Inc. (USA) )
- Scott, D. ( Xradia, Inc. (USA) )
- Yun, W. ( Xradia, Inc. (USA) )
- Publication title:
- Testing, Reliability, and Application of Micro- and Nano-Material Systems III
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5766
- Pub. Year:
- 2005
- Page(from):
- 40
- Page(to):
- 48
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819457479 [0819457477]
- Language:
- English
- Call no.:
- P63600/5766
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
3
Conference Proceedings
Dark-field image of full-field transmission hard x-ray microscope in 8-11 keV [6317-03]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
4
Conference Proceedings
Detection of collagen by second harmonic microscopy as a diagnostic tool for liver fibrosis (Invited Paper) [6089-48]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
5
Conference Proceedings
Micro- and nano-NDE systems for aircraft: great things in small packages (Invited Paper)
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
6
Conference Proceedings
Electron-beam lithography for micro- and nano-optical applications (Invited Paper)
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |