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X-ray refraction topography and computed tomography for NDE of lightweight materials(Keynote Paper)

Author(s):
Muller, B. R. ( Federal Institute for Materials Research and Testing(Germany) )
Lange, A. ( Federal Institute for Materials Research and Testing(Germany) )
Harwardt, M. ( Federal Institute for Materials Research and Testing(Germany) )
Hentschel, M. P. ( Federal Institute for Materials Research and Testing(Germany) )
Illerhaus, B. ( Federal Institute for Materials Research and Testing(Germany) )
Goebbels, J. ( Federal Institute for Materials Research and Testing(Germany) )
Bamberg, J. ( MTU Aero Engines GmbH(Germany) )
Heutling, F. ( MTU Aero Engines GmbH(Germany) )
3 more
Publication title:
Testing, Reliability, and Application of Micro- and Nano-Material Systems III
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5766
Pub. Year:
2005
Page(from):
1
Page(to):
8
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457479 [0819457477]
Language:
English
Call no.:
P63600/5766
Type:
Conference Proceedings

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