Blank Cover Image

Instrumentation for durability monitoring of a long-span cable-stayed bridge

Author(s):
  • Hua, X. G. ( The Hong Kong Polytechnic Univ. (Hong Kong China) )
  • Ni, Y. Q. ( The Hong Kong Polytechnic Univ. (Hong Kong China) )
  • Zhou, H. F. ( The Hong Kong Polytechnic Univ. (Hong Kong China) )
  • Ko, J. M. ( The Hong Kong Polytechnic Univ. (Hong Kong China) )
Publication title:
Smart structures and materials 2005 : Sensors and smart structures technologies for civil, mechanical, and aerospace systems : 7-10 March 2005, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5765
Pub. Year:
2005
Page(from):
982
Page(to):
991
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457462 [0819457469]
Language:
English
Call no.:
P63600/5765-2
Type:
Conference Proceedings

Similar Items:

Chen, Z.Q., Wang, X.Y., Ko, J.M., Ni, Y.Q., Spencer, B.F. Jr.,, Yang, G.

SPIE-The International Society for Optical Engineering

Wang,B.S., Liang,X.B., Ni,Y.Q., Ko,J.M.

SPIE-The International Society for Optical Engineering

Sun,B.N., Wang,Z.G., Ko,J.M., Ni,Y.Q.

SPIE-The International Society for Optical Engineering

Sun,Z.G., Ko,J.M., Ni,Y.Q.

SPIE-The International Society for Optical Engineering

Ni,Y.Q., Spencer Jr.,B.F., Ko,J.M.

SPIE-The International Society for Optical Engineering

Ni, Y.Q., Li, H., Wang, J.Y., Ko, J.M.

SPIE-The International Society for Optical Engineering

Ko, J.M., Zheng, G., Chen, Z.Q., Ni, Y.Q.

SPIE-The International Society for Optical Engineering

Ko,J.M., Ni,Y.Q., Chan,T.H.T.

SPIE - The International Society for Optical Engineering

Ko,J.M., Ni,Y.Q., Sun,Z.G., Chan,T.H.T.

SPIE-The International Society for Optical Engineering

Feng,M.Q., Kim,D.-K., Sheng,L.-H., Fiji,L.M., Kim,Y.J.

SPIE-The International Society for Optical Engineering

Ni, Y.Q., Fan, K.Q., Zheng, G., Chan, T.H.T., Ko, J.M.

SPIE-The International Society for Optical Engineering

Hemez, F.M., Sohn, H.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12