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Long-term reliability testing of packaged strain sensors

Author(s):
Inaudi, D. ( SMARTEC SA(Switzerland) )  
Publication title:
Smart structures and materials 2005 : Smart sensor technology and measurement systems : 7-9 March 2005, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5758
Pub. Year:
2005
Page(from):
405
Page(to):
408
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457394 [0819457396]
Language:
English
Call no.:
P63600/5758
Type:
Conference Proceedings

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