Requirement of in-field illumination control for low k1 imaging below 0.3
- Author(s):
Hwang, C. ( Samsung Electronics Co., Ltd. (Soufh Korea) ) Shin, J. ( Samsung Electronics Co., Ltd. (Soufh Korea) ) Lee, S.-J. ( Samsung Electronics Co., Ltd. (Soufh Korea) ) Woo, S.-G. ( Samsung Electronics Co., Ltd. (Soufh Korea) ) Cho, H.-K. ( Samsung Electronics Co., Ltd. (Soufh Korea) ) Moon, J.-T. ( Samsung Electronics Co., Ltd. (Soufh Korea) ) - Publication title:
- Optical microlithography XVIII : 1-4 March, 2005, San Jose, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5754
- Pub. Year:
- 2005
- Pt.:
- 3
- Page(from):
- 1548
- Page(to):
- 1556
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819457349 [0819457345]
- Language:
- English
- Call no.:
- P63600/5754
- Type:
- Conference Proceedings
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