Blank Cover Image

Mask fabrication towards sub-10 nm imprint lithography

Author(s):
Jung, G. Y. ( Hewlett-Packard Labs. (USA) )
Wu, W. ( Hewlett-Packard Labs. (USA) )
Li, Z. ( Hewlett-Packard Labs. (USA) )
Wang, S. Y. ( Hewlett-Packard Labs. (USA) )
Tong, W. M. ( Hewlett-Packard Labs. (USA) and The Hewlett-Packard Co. (USA) )
Williams, R. S. ( Hewleft-Parkard Labs. (USA) )
1 more
Publication title:
Emerging lithographic technologies IX : 1-3 March 2005, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5751
Pub. Year:
2005
Page(from):
382
Page(to):
391
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457318 [0819457310]
Language:
English
Call no.:
P63600/5751-1
Type:
Conference Proceedings

Similar Items:

Jung, G.-Y., Ganapathiappan, S., Li, X., Ohlberg, D.A.A., Olynick, D.L., Chen, Y., Wu, W., Wang, S.-Y., Tong, W.M., …

SPIE - The International Society of Optical Engineering

Coldsmith,J.E.M., Berger,K.W., Bozman,D.R., Cardinale,G.F., Folk,D.R., Henderson,C.C., O'Connell,D.J., …

SPIE - The International Society for Optical Engineering

Thompson, E., Rhyins, P.D., Voisin, R.D., Sreenivasan, S.V., Martin, P.M.

SPIE-The International Society for Optical Engineering

Lee,G., Koh,C.-W., Jung,J.-C., Jung,M.-H., Kong,K.-K., Kim,J.-S., Shin,K.-S., Choi,S.-J., Kim,Y.-S., Choi,Y.-J., …

SPIE-The International Society for Optical Engineering

3 Conference Proceedings Mask technology for EUV lithography

Bujak,M., Burkhart,S.C., Cerjan,C.J., Kearney,P.A., Moore,C.E., Prisbrey,S., Sweeney,D.W., Tong,W.M., Vernon,S.P., …

SPIE - The International Society for Optical Engineering

Z. Li, X. Li, O. A. A. Ohlberg, J. Straznicky, W. Wu

Society of Photo-optical Instrumentation Engineers

M. Dubov, S. R. Natarajan, J. A. R. Williams, I. Bennion

Society of Photo-optical Instrumentation Engineers

10 Conference Proceedings Masks for extreme ultraviolet lithography

Vernon,S.P., Kearney,P.A., Tong,W.M., Prisbrey,S., Larson,C., Moore,C.E., Weber,F.J., Cardinale,G.F., Yan,P., …

SPIE - The International Society for Optical Engineering

Colburn,M., Grot,A., Amistoso,M.N., Choi,B.J., Bailey,T.C., Ekerdt,J.G., Sreenivasan,S.V., Hollenhorst,J., Willson,C.G.

SPIE - The International Society for Optical Engineering

Deng, C., Wu, J.C., Lantz, S., Barbero, C.J., Sigmon, T.W., Wybourne, M.N.

American Institute of Chemical Engineers

Maldonado, J.R., Coyle, S.T., Shamoun, B., Yu, M., Thomas, T.N., Holmgren, D.E., Chen, X., DeVore, B., Scheinfein, M.R., …

SPIE - The International Society of Optical Engineering

Ganguli, R., Colbern, S.G., Morris, M.W., Meixner, D.L., Roy Chaudhuri, S.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12