Blank Cover Image

False positive reduction for ground glass opacities in CT by feature analysis based on a multiple region extraction technique

Author(s):
Harada, M. ( Toyohashi Univ. of Technology (Japan) )
Takizawa, H. ( Toyohashi Univ. of Technology (Japan) )
Yamamoto, S. ( Toyohashi Univ. of Technology (Japan) )
Matsumoto, T. ( National Institute of Radiological Sciences (Japan) )
Tateno, Y. ( National Institute of Radiological Sciences (Japan) )
Iinuma, T. ( National Institute of Radiological Sciences (Japan) )
Doi, K. ( The Univ. of Chicago (USA) )
2 more
Publication title:
Medical Imaging 2005: Image Perception, Observer Performance, and Technology Assessment
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5749
Pub. Year:
2005
Page(from):
458
Page(to):
465
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819457233 [081945723X]
Language:
English
Call no.:
P63600/5749
Type:
Conference Proceedings

Similar Items:

Tanino, M., Takizawa, H., Yamamoto, S., Matsumoto, T., Tateno, Y., Iinuma, T.

SPIE-The International Society for Optical Engineering

Jiang,H., Masuto,N., Nishimura,O., Yamamoto,S., Iisaku,S., Matsumoto,M., Tateno,Y., Iinuma,T., Matsumoto,T.

SPIE - The International Society for Optical Engineering

Ezoe, T., Takizawa, H., Yamamoto, S., Shimizu, A., Matsumoto, T., Tateno, Y., Iinuma, T., Matsumoto, M.

SPIE-The International Society for Optical Engineering

Okumura,T., Miwa,T., Kako,J., Yamamoto,S., Matsumoto,M., Tateno,Y., Iinuma,T., Matsumoto,T.

SPIE-The International Society for Optical Engineering

Fukano, G., Takizawa, H., Shigemoto, K., Yamamoto, S., Matsumoto, T., Tateno, Y., Iinuma, T.

SPIE-The International Society for Optical Engineering

T. Matsumoto, A. Furukawa, K. Nisizawa, S. Wada, S. Yamamoto, K. Murao, M. Matsumoto, S. Sone, K. Fukuhisa, T. Iinuma, …

SPIE - The International Society of Optical Engineering

Nakamura, Y., Fukano, G., Takizawa, H., Mizuno, S., Yamamoto, S., Matsumoto, T., Tateno, Y., Iinuma, T.

SPIE - The International Society of Optical Engineering

Yoshida,H., Doi,K.

SPIE - The International Society for Optical Engineering

Takizawa, H., Yamamoto, S., Matsumoto, T., Tateno, Y., Iinuma, T., Matsumoto, M.

SPIE-The International Society for Optical Engineering

Li,Q., Katsuragawa,S., Engelmann,R.M., Armato Ⅲ,S.G., MacMahon,H., Doi,K.

SPIE-The International Society for Optical Engineering

Takizawa,H., Fukano,G., Yamamoto,S., Matsumoto,T., Tateno,Y., Iinuma,T., Matsumoto,M.

SPIE - The International Society for Optical Engineering

Xu,X.-W., Katsuragawa,S., Ashizawa,K., MacMahon,H., Doi,K.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12