Blank Cover Image

Improvement of ultrasound image based on wavelet transform: speckle reduction and edge enhancement

Author(s):
  • Kim, Y. S. ( Korea Advanced Institute of Science and Technology (South Korea) )
  • Ra, J. B. ( Korea Advanced Institute of Science and Technology (South Korea) )
Publication title:
Medical Imaging 2005: Image Processing
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5747
Pub. Year:
2005
Page(from):
1085
Page(to):
1092
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819457219 [0819457213]
Language:
English
Call no.:
P63600/5747-2
Type:
Conference Proceedings

Similar Items:

J.E. Odegard, H. Guo, M. Lang, C.S. Burrus, R.O. Wells

Society of Photo-optical Instrumentation Engineers

Kim, S.J., Jeong, J.C.

SPIE-The International Society for Optical Engineering

Xu,B., Fu,C., Ma,J.

SPIE - The International Society for Optical Engineering

Sveinsson,J.R., Benediktsson,J.A.

SPIE-The International Society for Optical Engineering

Leguizamon, S.

ESA Publications Division

J. Hou, C. Xiong, S. Chen, X. He

Society of Photo-optical Instrumentation Engineers

Lee, D., Kim, Y. S., Ra, J. B.

SPIE - The International Society of Optical Engineering

Kim, J., Lee, Y., Kwak, S.

SPIE - The International Society of Optical Engineering

Xiao, C., Zhang, S., Cheng, S., Chen, Y.

SPIE - The International Society of Optical Engineering

H.-K. Lee, S.W. Kim, K.S. Kim, S.-D. Choi

Society of Photo-optical Instrumentation Engineers

Abdel-Malek,A.A., Dentinger,A.M.

SPIE-The International Society for Optical Engineering

Escalante-Ramirez,B., Lopez-Miranda,J.R.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12