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Numerical study on thickness dependence of passivation layer in top-emission organic light-emitting devices

Author(s):
Shiau, C.-C. ( National Taiwan Univ. (Taiwan) )
Chen, H.-C. ( National Taiwan Univ. (Taiwan) )
Lee, J.-H. ( National Taiwan Univ. (Taiwan) )
Kiang, Y.-W. ( National Taiwan Univ. (Taiwan) )
Yang, C. C. ( National Taiwan Univ. (Taiwan) )
Chang, C.-H. ( Industrial Technology Research Institute (Taiwan) )
1 more
Publication title:
Projection Displays XI
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5740
Pub. Year:
2005
Page(from):
149
Page(to):
157
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457141 [0819457140]
Language:
English
Call no.:
P63600/5740
Type:
Conference Proceedings

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