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A new method for sensitivity analysis of photonic crystal devices

Author(s):
Publication title:
Photonic crystal materials and devices III : 24-27 January, 2005, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5733
Pub. Year:
2005
Page(from):
348
Page(to):
355
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457073 [0819457078]
Language:
English
Call no.:
P63600/5733
Type:
Conference Proceedings

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