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Backside sample preparation with laser-enhanced chemical etching for infrared photon imaging

Author(s):
Deng, Q. ( Chartered Semiconductor Manufacturing Ltd. (Singapore) )
Mai, Z. ( Chartered Semiconductor Manufacturing Ltd. (Singapore) )
He, R. ( Chartered Semiconductor Manufacturing Ltd. (Singapore) )
Tao, T. ( Chartered Semiconductor Manufacturing Ltd. (Singapore) )
Lam, J. ( Chartered Semiconductor Manufacturing Ltd. (Singapore) )
Lu, Y.F. ( Univ. of Nebraska/Lincoln (USA) )
1 more
Publication title:
Photon Processing in Microelectronics and Photonics IV
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5713
Pub. Year:
2005
Page(from):
432
Page(to):
435
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819456878 [081945687X]
Language:
English
Call no.:
P63600/5713
Type:
Conference Proceedings

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