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Tomographic imagery by interference microscopy

Author(s):
Dubois, A. ( Ecole Supe'rieure de Physique et Chimie Industrielles. CNRS (France) )
Guiot, E. ( Ecole Supe'rieure de Physique et Chimie Industrielles. CNRS (France) )
Schwart, W. ( Ecole Supe'rieure de Physique et Chimie Industrielles. CNRS (France) )
Moneron, G. ( Ecole Supe'rieure de Physique et Chimie Industrielles. CNRS (France) )
Grieve, K. ( Ecole Supe'rieure de Physique et Chimie Industrielles. CNRS (France) )
Boccara, C. ( Ecole Supe'rieure de Physique et Chimie Industrielles. CNRS (France) )
1 more
Publication title:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5701
Pub. Year:
2005
Page(from):
146
Page(to):
151
Pages:
6
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819456755 [0819456756]
Language:
English
Call no.:
P63600/5701
Type:
Conference Proceedings

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