Stereovision-based close-up dimensional inspection

Stereovision-based close-up dimensional inspection

Author(s):

Mitchell, J. P. ( McMaster Univ. (Canada) )
Spence, A. D. ( McMaster Univ. (Canada) )
Capson, D. W. ( McMaster Univ. (Canada) )
Chan, H. ( McMaster Univ. (Canada) )
Goldstein, M. ( McMaster Univ. (Canada) )

Publication title:

Machine Vision Applications in Industrial Inspection XIII

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5679

Pub. Year:

2005

Page(from):

166

Page(to):

177

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819456526 [0819456527]

Language:

English

Call no.:

P63600/5679

Type:

Conference Proceedings

Details

TDL ID:	ZA00014896
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Machine Vision Applications in Industrial Inspection
Conf. info. (Number):	2005 : 13th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2005.01.17-2005.01.18

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