Removal of spatially correlated noise by independent component analysis

Removal of spatially correlated noise by independent component analysis

Author(s):

Zeng, X. ( California State Univ. /Northridge (USA) )
Chen, X. ( Ritsumeikan Univ. (Japan) )
Nakao, Z. ( Univ. of the Ryukyus (Japan) )
Alphen, D. van ( California State Univ. /Northridge (USA) )

Publication title:

Applications of neural networks and machine learning in image processing IX : 19-20 January 2005, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5673

Pub. Year:

2005

Page(from):

99

Page(to):

105

Pages:

7

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819456465 [0819456462]

Language:

English

Call no.:

P63600/5673

Type:

Conference Proceedings

Details

TDL ID:	ZA00014890
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Applications of neural networks and machine learning in image processing
Conf. info. (Number):	2005 : 9th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2005.01.19-2005.01.20

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