Digital image comparison using feature extraction and luminance matching

Digital image comparison using feature extraction and luminance matching

Author(s):

Bachnak, R. A. ( Texas A & M Univ. (USA) )
Steidley, C. W. ( Texas A & M Univ. (USA) )
Funtanilla, J. ( Texas A & M Univ. (USA) )

Publication title:

Image processing : algorithms and systems IV : 17-18 January 2005, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5672

Pub. Year:

2005

Page(from):

12

Page(to):

22

Pages:

11

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819456458 [0819456454]

Language:

English

Call no.:

P63600/5672

Type:

Conference Proceedings

Details

TDL ID:	ZA00014889
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Image processing
Conf. info. (Number):	2005 : 4th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2005.01.17-2005.01.18

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