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Annular subaperture interferometric testing technique for large aspheric surfaces

Author(s):
  • Hou, X. ( Institute of Optics and Eiectronics, CAS (China) and Graduate School of the Chinese Academy of Sciences (China) )
  • Wu, F. ( Institute of Optics and Electronics, CAS (China) )
  • Wu, S. ( Institute of Optics and Electronics, CAS (China) )
  • Chen, Q. ( Institute of Optics and Electronics, CAS (China) )
Publication title:
Optical design and testing II : 8-12 November 2004, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5638
Pub. Year:
2004
Page(from):
992
Page(to):
997
Pages:
6
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455932 [0819455938]
Language:
English
Call no.:
P63600/5638-2
Type:
Conference Proceedings

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