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A new model with the active-lap

Author(s):
Wan, Y. ( Institute of Optics and Electronics, CAS (China) )
Yuan, J. ( Institute of Optics and Electronics, CAS (China) )
Yang, L. ( Institute of Optics and Electronics, CAS (China) )
Fan, B. ( Institute of Optics and Electronics, CAS (China) )
Zhen, Y. ( Institute of Optics and Electronics, CAS (China) )
Zeng, Z. ( Institute of Optics and Electronics, CAS (China) )
1 more
Publication title:
Optical design and testing II : 8-12 November 2004, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5638
Pub. Year:
2004
Page(from):
858
Page(to):
864
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455932 [0819455938]
Language:
English
Call no.:
P63600/5638-2
Type:
Conference Proceedings

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