Research on modern testing technique of optical system resolution based on CCD imaging theory and DLP occurring figure device

Research on modern testing technique of optical system resolution based on CCD imaging theory and DLP occurring figure device

Author(s):

Li, Z. ( Changchun Univ. of Science and Technology (China) )
Li, L. ( Changchun Univ. of Science and Technology (China) )
Zeng, C. ( Institute of Tracking and Telecommunication Technology (China) )
An, Z. ( Changchun Univ. of Science and Technology (China) )

Publication title:

Optical design and testing II : 8-12 November 2004, Beijing, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5638

Pub. Year:

2004

Page(from):

777

Page(to):

782

Pages:

6

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455932 [0819455938]

Language:

English

Call no.:

P63600/5638-2

Type:

Conference Proceedings

Details

TDL ID:	ZA00014853
Series ID:	PA00000029
Conf. info. (Name):	Photonics Asia : Optical design and testing
Conf. info. (Number):	2004 : 2nd
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	2004.11.08-2004.11.12

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