Image estimation based on depth-variant imaging model in three-dimensional microscopy
- Author(s):
- Publication title:
- Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5637
- Pub. Year:
- 2004
- Page(from):
- 590
- Page(to):
- 598
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819455925 [081945592X]
- Language:
- English
- Call no.:
- P63600/5637
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
A robust blind deconvolution based on estimation of point spread function parameters
SPIE - The International Society of Optical Engineering |
7
Conference Proceedings
Initital research of three-dimensional volumetric display based on di-frequency upconversion
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
3
Conference Proceedings
Imaging and measurement techniques for three-dimensional microstructure by digital holographic microscopy
Society of Photo-optical Instrumentation Engineers |
Trans Tech Publications |
4
Conference Proceedings
Image estimation accounting for point-spread function depth cariation in three-dimensional fluorescence microscopy
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
Real-time image matching location technology with joint-transform correlator
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Three-dimensional modeling of near-field imaging in subwavelength periodic structures
SPIE-The International Society for Optical Engineering |
6
Conference Proceedings
Research on three-dimensional visualization based on virtual reality and Internet
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |