Blank Cover Image

A robust blind deconvolution based on estimation of point spread function parameters

Author(s):
Publication title:
Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5637
Pub. Year:
2004
Page(from):
581
Page(to):
589
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455925 [081945592X]
Language:
English
Call no.:
P63600/5637
Type:
Conference Proceedings

Similar Items:

Tao, Q., He, X., Zhao, J., Teng, Q., Chen, J.

SPIE - The International Society of Optical Engineering

B. Zuo, J. Tian, L. Zu, A. Chen

Society of Photo-optical Instrumentation Engineers

X. Chen, Z. Fan

Society of Photo-optical Instrumentation Engineers

Wu,X., Liu,X., Zhou,Y., Tao,D., He,X., Teng,Q.

SPIE-The International Society for Optical Engineering

Miura, N., Kikuchi, K.

SPIE - The International Society of Optical Engineering

Rolland P. J., Barrett H. H., Seeley W. G.

Springr-Verlag

Z. Chen, Y. Tao

Society of Photo-optical Instrumentation Engineers

Teng,Q., He,X., Jiang,L., Deng,Z., Wu,X., Tao,D.

SPIE-The International Society for Optical Engineering

Yagle, A.E., Al-Salem, F.M.

SPIE - The International Society of Optical Engineering

Dong,C.-Y., Bevan,E.A., Hsu,L., Konig,K., So,P.T.C.

SPIE-The International Society for Optical Engineering

J. Huang, M. Shen, Q. Li

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12