Shape of cutting chip monitoring system based on LabVIEW

Author(s):

• Zhao, Y. ( Harbin Univ. of Science and Technology (China) )
• Wang, P. ( Harbin Univ. of Science and Technology (China) )
• Zhang, G. ( Harbin Univ. of Science and Technology (China) )
• Liu, X. ( Harbin Univ. of Science and Technology (China) )

Publication title:

Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5637

Pub. Year:

2004

Page(from):

518

Page(to):

523

Pages:

6

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455925 [081945592X]

Language:

English

Call no.:

P63600/5637

Type:

Conference Proceedings