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Influence of preparation technique on the microscopic structure and surface morphology of nanometer Ti02 thin films

Author(s):
Hu, X. ( Northwest Univ. (China) )
Fan, J. ( Northwest Univ. (China) )
Li, T. ( Northwest Univ. (China) )
Zhang, D. ( Northwest Univ. (China) )
Bai, J. ( Northwest Univ. (China) )
Hou, X. ( Northwest Univ. (China) and Xi'an Institute of Optics and Precision Mechanics, CAS (China) )
1 more
Publication title:
Nanophotonics, Nanostructure, and Nanometrology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5635
Pub. Year:
2004
Page(from):
390
Page(to):
398
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455901 [0819455903]
Language:
English
Call no.:
P63600/5635
Type:
Conference Proceedings

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