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Visualizing substructure of Ca2* waves by total internal reflection fluorescence microscopy

Author(s):
Publication title:
Nanophotonics, Nanostructure, and Nanometrology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5635
Pub. Year:
2004
Page(from):
69
Page(to):
76
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455901 [0819455903]
Language:
English
Call no.:
P63600/5635
Type:
Conference Proceedings

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