Influence of probe tip size and incident light polarization on resolution in near-field scanning optical microscopy (Invited Paper)

Influence of probe tip size and incident light polarization on resolution in near-field scanning optical microscopy (Invited Paper)

Author(s):

Wang, G. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) )
Wu, Q. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) )
Xu, Z. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) )

Publication title:

Nanophotonics, Nanostructure, and Nanometrology

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5635

Pub. Year:

2004

Page(from):

18

Page(to):

30

Pages:

13

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455901 [0819455903]

Language:

English

Call no.:

P63600/5635

Type:

Conference Proceedings

Details

TDL ID:	ZA00014848
Series ID:	PA00000029
Conf. info. (Name):	Photonics Asia : Nanophotonics, Nanostructure, and Nanometrology
Conf. info. (Number):	2004
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	2004.11.08-2004.11.10

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