Wavelength-shifting interferometry by a wide tunable laser source with a new phase-shifting technique

Author(s):

• Higashi, M. ( Univ. of Industrial Technology (Japan) )
• Takahashi, T. ( Univ. of Industrial Technology (Japan) )
• Onodera, R. ( Univ. of Industrial Technology (Japan) )
• Ishii, Y. ( Univ. of Industrial Technology (Japan) )

Publication title:

Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5633

Pub. Year:

2004

Page(from):

598

Page(to):

602

Pages:

5

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455888 [0819455881]

Language:

English

Call no.:

P63600/5633

Type:

Conference Proceedings