Blank Cover Image

Research on the nonuniformity correction of linear TDI CCD remote camera

Author(s):
  • Liu, Y. ( Changchun Institute of Optics, Fine Mechanics and Physics, CAS (China) )
  • Hao, Z. ( Changchun Institute of Optics, Fine Mechanics and Physics, CAS (China) )
Publication title:
Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5633
Pub. Year:
2004
Page(from):
527
Page(to):
535
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455888 [0819455881]
Language:
English
Call no.:
P63600/5633
Type:
Conference Proceedings

Similar Items:

Liu Y., Hao Z.

SPIE - The International Society of Optical Engineering

J. Ln, J. Liu, Y. Wang, L. Yang

Society of Photo-optical Instrumentation Engineers

Liu, Y., Bao, H., Li, J., Ruan, J., Hao, Z.

SPIE - The International Society of Optical Engineering

Hao, H., Li, L., Deng, Y.

SPIE - The International Society of Optical Engineering

Wang,H., Wei,Z.

SPIE-The International Society for Optical Engineering

9 Conference Proceedings The design of EUV CCD camera

Y. Shang, Y. Guan, Y. Liu, X. Zhao

Society of Photo-optical Instrumentation Engineers

Liu, J., Li, J., Hao, Z.

SPIE - The International Society of Optical Engineering

Hao,Q., Cao,M., Zhao,Y., Li,D.

SPIE-The International Society for Optical Engineering

Y. Liu

Society of Photo-optical Instrumentation Engineers

L. Fang, Q. Liu, D. Li, S. Liu

Society of Photo-optical Instrumentation Engineers

Li, Ke Ming, Zhang, Chao

Trans Tech Publications

Jiang,G., Jia,J., Liu,S.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12