Blank Cover Image

Analysis and study on the stadia of low light level imaging system

Author(s):
  • Bai, L. ( Nanjing Univ. of Science and Technology (China) )
  • Qian, W. ( Nanjing Univ. of Science and Technology (China) )
  • Zhang, Y. ( Nanjing Univ. of Science and Technology (China) )
  • Zhang, B. ( Nanjing Univ. of Science and Technology (China) )
Publication title:
Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5633
Pub. Year:
2004
Page(from):
460
Page(to):
469
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455888 [0819455881]
Language:
English
Call no.:
P63600/5633
Type:
Conference Proceedings

Similar Items:

Bai, L., Qian, W., Zhang, Y., Zhang, B.

SPIE - The International Society of Optical Engineering

Zhang, Y., Zhang, B., Bai, L., Qian, W.

SPIE - The International Society of Optical Engineering

Bai,L., Zhang,B., Liu,Y., Chen,Q.

SPIE-The International Society for Optical Engineering

Bai, L., Qian, W., Zhang, Y., Zhang, B.

SPIE-The International Society for Optical Engineering

L. Bai, B. Zhang, Q. Chen, Y. Li

Society of Photo-optical Instrumentation Engineers

Zhang, Y., Zhang, B., Bai, L., Qian, W.

SPIE - The International Society of Optical Engineering

Bai,L., Chen,Q., Yin,D., Zhang,B.

SPIE-The International Society for Optical Engineering

Qian, W., Bai, L., Gu, G., Zhang, B.

SPIE - The International Society of Optical Engineering

Sun, S., Zhang, B., Wang, L., Bai, L.

SPIE-The International Society for Optical Engineering

Bai,L., Chen,Q., Gu,G., Zhang,B.

SPIE-The International Society for Optical Engineering

Bai,L., Chen,Q., Gu,G., Zhang,B.

SPIE-The International Society for Optical Engineering

Bai,L., Gu,G., Chen,Q., Zhang,B.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12