Characterization of FDTD artifacts and modes in photonic crystals

Characterization of FDTD artifacts and modes in photonic crystals

Author(s):

Lopez-Alonso, J. M. ( Univ. Complutense de Madrid (Spain) )
Rico-Garcia, J. M. ( Univ. Complutense de Madrid (Spain) )
Alda, J. ( Univ. Complutense de Madrid (Spain) )

Publication title:

Integrated optical devices, nanostructures, and displays : 26-28 October 2004, London, United Kingdom

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5618

Pub. Year:

2004

Page(from):

39

Page(to):

47

Pages:

9

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455710 [0819455717]

Language:

English

Call no.:

P63600/5618

Type:

Conference Proceedings

Details

TDL ID:	ZA00014824
Series ID:	PA00000029
Conf. info. (Name):	SPIE Security and Defence : tegrated Optical Devices, Nanostructures, and Displays
Conf. info. (Number):	2004
Conf. info. (Venue):	London, UK
Conf. info. (Date):	2004.10.26-2004.10.28

Similar Items:

1 Conference Proceedings Multivariate analysis of photonic crystal microcavities with fabrication defects Rico-Garcia, J. M., Lopez-Alonso, J. M., Alda, J. SPIE - The International Society of Optical Engineering	7 Conference Proceedings Characterization of scenarios for multiband and hyperspectral imagers Lopez-Alonso, J.M., Alda, J. SPIE - The International Society of Optical Engineering
2 Conference Proceedings FDTD analysis of nano-antenna structures with dispersive materials at optical frequencies Rico-Garcia, J. M., Lopez-Alonso, J. M., Alda, J. SPIE - The International Society of Optical Engineering	8 Conference Proceedings Spatial-temporal characterization of noise in web cameras Lopez-Alonso, J.M., Alda, J. SPIE-The International Society for Optical Engineering
3 Conference Proceedings Characterization of phase artifacts for focal plane arrays Lopez-Alonso, J.M., Alda, J. SPIE - The International Society of Optical Engineering	9 Conference Proceedings Alignment characterization in micro and nano technologies [5987-20] Lopez-Alonso, J. M., Alda, J., Boreman, G. SPIE - The International Society of Optical Engineering
4 Conference Proceedings Characterization of hyperspectral imagers and scenes: background and equipment artifacts Lopez-Alonso, J. M., Alda, J. SPIE - The International Society of Optical Engineering	10 Conference Proceedings Automatic classification of noise for infrared images into processes by means of the principal component analysis Lopez-Alonso, J.M., Alda, J. SPIE-The International Society for Optical Engineering
5 Conference Proceedings Spatial characterization of light detectors with nanometric resolution Alda, J., Lopez-Alonso, J.M., Rico-Garcia, J.M., Zoido, J., Boreman, G. SPIE - The International Society of Optical Engineering	11 Conference Proceedings Principal component analysis of noise in an image-acquisition system: bad pixel extraction Lopez-Alonso, J.M., Alda, J. SPIE-The International Society for Optical Engineering
6 Conference Proceedings Finite-difference time-domain simulation of low-F# Fresnel zone plates coupled to IR antennas Rico-Garcia, J. M., Lopez-Alonso, J. M., Lail, B., Boreman, G. D., Alda, J. SPIE - The International Society of Optical Engineering	12 Conference Proceedings Matricial representation of the transfer function for aliased systems Lopez-Alonso, J.M., Alda, J. SPIE-The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12