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Error metric analysis and its applications

Author(s):
  • Tian, Q. ( Univ. of Texas/San Antonio (USA) )
  • Xue, Q. ( Univ. of Texas/San Antonio (USA) )
  • Sebe, N. ( Univ. of Amsterdam (Netherlands) )
  • Huang, T. S. ( Univ. of Illinois/Urbana-Champaign (USA) )
Publication title:
Internet Multimedia Management Systems V
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5601
Pub. Year:
2004
Page(from):
46
Page(to):
57
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455543 [0819455547]
Language:
English
Call no.:
P63600/5601
Type:
Conference Proceedings

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