Beyond sensor-assisted diagnosis of used products

Beyond sensor-assisted diagnosis of used products

Author(s):

Pochampally, K. K. ( Northeastern Univ. (USA) )
Vadde, S. ( Northeastern Univ. (USA) )
Kamarthi, S. V. ( Northeastern Univ. (USA) )
Gupta, S. M. ( Northeastern Univ. (USA) )

Publication title:

Environmentally conscious manufacturing IV : 26-27 October, 2004, Philadelphia, Pennsylvania, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5583

Pub. Year:

2004

Page(from):

138

Page(to):

146

Pages:

9

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455369 [0819455369]

Language:

English

Call no.:

P63600/5583

Type:

Conference Proceedings

Details

TDL ID:	ZA00014789
Series ID:	PA00000029
Conf. info. (Name):	Optics East : Environmentally conscious manufacturing
Conf. info. (Number):	2004 : 6th
Conf. info. (Venue):	Philadelphia, PA, USA
Conf. info. (Date):	2004.10.26-2004.10.27

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