Probes for a scanning near-field optical microscope on the base of tapered single-mode optical fiber

Probes for a scanning near-field optical microscope on the base of tapered single-mode optical fiber

Author(s):

Dryakhlushin, V. F. ( Institute for Physics of Microstructures (Russia) )
Klimov, A. Yu. ( Institute for Physics of Microstructures (Russia) )
Rogov, V. V. ( Institute for Physics of Microstructures (Russia) )

Publication title:

Advanced optoelectronics and lasers : 16-20 September, 2003, Alushta, Ukraine

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5582

Pub. Year:

2004

Page(from):

296

Page(to):

303

Pages:

8

Pub. info.:

Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455352 [0819455350]

Language:

English

Call no.:

P63600/5582

Type:

Conference Proceedings

Details

TDL ID:	ZA00014788
Series ID:	PA00000029
Conf. info. (Name):	Advanced optoelectronics and lasers
Conf. info. (Number):	2003
Conf. info. (Venue):	Alushta, Ukraine
Conf. info. (Date):	2003.09.16-2003.09.20

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