Blank Cover Image

Placing assist features in layout using a process model

Author(s):
Publication title:
24th Annual BACUS Symposium on Photomask Technology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5567
Pub. Year:
2004
Page(from):
1332
Page(to):
1338
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455130 [081945513X]
Language:
English
Call no.:
P63600/5567-2
Type:
Conference Proceedings

Similar Items:

Melvin, L.S., III, Shiely, J.P., Cork, C.M., Rieger, M.L.

SPIE - The International Society of Optical Engineering

III, L.S.M., Shiely, J.P., Rieger, M.L., Painter, B.

SPIE-The International Society for Optical Engineering

Beale, D.F., Shiely, J.P., Melvin, L.L., III, Rieger, M.L.

SPIE - The International Society of Optical Engineering

Melvin III, L. S., Shiely, J. P., Yan, Q.

SPIE - The International Society of Optical Engineering

Yan, Q., Melvin III, L. S., Shiely, J. P.

SPIE - The International Society of Optical Engineering

Melvin, L.S., III, Rieger, M.L.

SPIE - The International Society of Optical Engineering

Melvin, L.S., III, Shiely, J.P., Rieger, M.L., Painter, B.

SPIE-The International Society for Optical Engineering

Melvin III, S. L., Mayhew, P. J., Painter, D. B., Barnes, D. L.

SPIE - The International Society of Optical Engineering

Q. Yan, Z. Deng, J. Shiely, L. Melvin

SPIE - The International Society of Optical Engineering

11 Conference Proceedings Verifying RET mask layouts

Mayhew, J.P., Rieger, M.L., Li, J.W., Zhang, L., Tang, Z.W., Shiely, J.P.

SPIE-The International Society for Optical Engineering

Melvin III, L. S., Drapeau, M., Huang, J.

SPIE - The International Society of Optical Engineering

Barnes, L. D., Painter, B. D., Melvin III, L. S.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12