High-resolution actinic imaging and phase metrology of 193-nm CPL reticles

High-resolution actinic imaging and phase metrology of 193-nm CPL reticles

Author(s):

Merriam, A. J. ( Actinix (USA) )

Jacob, J. J. ( Actinix (USA) )

Van Den Broeke, D. ( ASML MaskTools, Inc. (USA) )

Hsu, S. ( ASML MaskTools, Inc. (USA) )

Chen, J. F. ( ASML MaskTools, Inc. (USA) )

Kasprowicz, B. ( Photronics Inc. (USA) )

1 more

Publication title:

24th Annual BACUS Symposium on Photomask Technology

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5567

Pub. Year:

2004

Page(from):

894

Page(to):

904

Pages:

11

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455130 [081945513X]

Language:

English

Call no.:

P63600/5567-2

Type:

Conference Proceedings

Details

TDL ID:	ZA00014770
Series ID:	PA00000029
Conf. info. (Name):	Annual BACUS Symposium on Photomask Technology
Conf. info. (Number):	2004 : 24th
Conf. info. (Venue):	Monterey, CA, USA
Conf. info. (Date):	2004.09.14-2004.09.17

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