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Further characterization of Rockwell Scientific LWIR HgCdTe detector arrays

Author(s):
Bacon, C. M. ( Univ. of Rochester (USA) )
McMurtry, C. W. ( Univ. of Rochester (USA) )
Pipher, J. L. ( Univ. of Rochester (USA) )
Forrest, W. J. ( Univ. of Rochester (USA) )
Garnett, J. D. ( Rockwell Scientific Co. (USA) )
Lee, D. ( Rockwell Scientific Co. (USA) )
Edwall, D. D. ( Rockwell Scientific Co. (USA) )
2 more
Publication title:
Infrared systems and photoelectronic technology : 2-3, 5 August 2004, Denver, Colorado, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5563
Pub. Year:
2004
Page(from):
35
Page(to):
45
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455017 [0819455016]
Language:
English
Call no.:
P63600/5563
Type:
Conference Proceedings

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