Optical properties and application of uranium-based thin films for the extreme ultraviolet and soft x-ray region
- Author(s):
- Sandberg, R.L. ( Brigham Young Univ. (USA) )
- Allred, D.D. ( Brigham Young Univ. (USA) )
- Lunt, S. ( Brigham Young Univ. (USA) )
- Urry, M.K. ( Brigham Young Univ. (USA) )
- Turley, R.S. ( Brigham Young Univ. (USA) )
- Publication title:
- Optical constants of materilas for UV to x-ray wavelengths : 4-5 August 2004, Denver, Colorado, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5538
- Pub. Year:
- 2004
- Page(from):
- 107
- Page(to):
- 118
- Pages:
- 12
- Pub. info.:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819454768 [0819454761]
- Language:
- English
- Call no.:
- P63600/5538
- Type:
- Conference Proceedings
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